近红外光谱，用于监控转鼓造粒机
AN-NIR-016
zh
本应用简报介绍一种新型传感器设计的可能用途，该传感器可与 NIRS XDS Process Analyzer 组合使用，以测定高剪切造粒的干燥阶段中的溶剂残留量。 该系统配置降低了粉末样品密度分布的散布程度，使其可以直接在进程中针对水和溶剂准建模。
This Application Note describes the utilization possibilities of a new sensor design that permits, in combination with an NIRS XDS Process Analyzer, the determination of solvent residues in a High-Shear Granulator during the drying phase. This system configuration reduces the scattering of the density distribution of the powder samples so that it is possible, directly in the process, to model the water and solvent content precisely.