Fluorescence-free 785 nm material identification with MIRA XTR DS
vi
Free white paper outlines the advantages of MIRA XTR DS and the XTR method (Raman eXTRaction) giving application examples for fluorescence-free material identification with handheld Raman spectrometers.
A comparison of 1064 nm and XTR® Raman spectroscopy
Fluorescence interference is one of the last barriers to the widespread application of 785 nm handheld Raman systems for material identification. And it is a formidable barrier. Fluorescence, from the target analyte or from other substances present in a mixture with the target, can obscure the Raman signal and prevent positive identification.
MIRA XTR DS is the next evolution in Raman spectroscopy. It combines the smaller size, higher resolution, and lower power consumption of a 785 nm Raman instrument with revolutionary patent pending technology to eXTRact Raman data, even from fluorescent samples – no need for a 1064 laser!