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Reliable and precise analyzers are needed to meet the stringent quality parameters needed to produce advanced semiconductors and optoelectronics
The production of semiconductors requires high quality standards to eliminate trace contaminants, a primary cause of wafer defects. Monitoring the water purity, acids in etching baths, metals content in plating baths, or ionic impurities is crucial to optimize semiconductor production efficiency and increase yield.
Trace analysis presents special challenges to measuring devices and analytical methods. Matrix effects are usually intensified by the low concentration of the analytes. Metrohm offers integrated sample preparation, such as pre-concentration or matrix elimination, for the most accurate results.
Metrohm offers top-quality analytical instruments for both laboratory and process stream applications, ensuring precise and reliable analysis from monitoring bath compositions to detecting impurities and more. You can also rely on our expertise and first-class, on-site service to support and enhance your semiconductor production.
Discover our latest solutions for your analysis
Automated CVS method development and optimization of multicomponent plating baths
Download this White Paper to learn more about how to optimize CVS methods for the analysis of electroplating copper baths.
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